Method for Accelerated Lifetesting of Large Area OLED Lighting Panels

Abstract

A method for accelerated life testing of organic devices, and in particular large area organic emissive devices, is provided. The first method comprises obtaining one or more individual organic emissive devices, each having a first organic stack comprising one or more organic layers. The lifetime of each of the one or more individual organic emissive devices is measured at one or more temperatures at a non-heating current density. Based upon the measured lifetimes at the non-heating current density of the one or more devices, the device lifetime is determined for a selected luminance. An organic emissive panel is also obtained having a second organic stack that consists essentially of the one or more organic layers of the first organic stack. The junction temperature of the organic emissive panel is then determined at a heating current density. Based upon the junction temperature and the device lifetime of the one or more individual organic emissive devices at the selected luminance, the expected lifetime of the organic emissive panel is then determined at the heating current density.

Dependencies are inferred from the claim text.