Test probe with ceramic coating and test instrument
OwnerMao Chuan Wang, Dao Jun Yang +1inventors
InventorsMao Chuan Wang, Dao Jun Yang, Xian Yuan Xie
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Abstract
The present invention discloses a test probe including a conductive member having a first end defined by an electrically conductive tip, and an insulative member surrounding a first portion of the conductive member. The second portion of the conductive member between the first end and the first portion is coated with a layer of insulative material. The test probe in the present invention does not require separate probe tips to be carried for use on various test applications but still meet the safety requirement of IEC standard.
Claims10
A test probe, comprising:
- a) a conductive member having a first end defining by an electrically conductive tip;
- b) an insulative member surrounding a first portion of said conductive member;
- and
- wherein a second portion of said conductive member between the first end and said first portion is coated with a layer of insulative material.
A test instrument, comprising:
- a) an output terminal;
- b) a test probe coupled to the output terminal;
- said test probe further comprising:
- i) a conductive member having a first end defined by an electrically conductive tip;
- ii) an insulative member surrounding a first portion of said conductive member;
- wherein a second portion of said conductive member between said first end and said first portion is coated with a layer of insulative material.
Dependencies are inferred from the claim text.