Socket, and test apparatus and method using the socket
AssigneeSamsung Electronics Co., Ltd.
InventorByeong-Hwan Cho
Life of this patent
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Abstract
An apparatus for testing electric characteristics of a test object including first connection terminals on a bottom surface and second connection terminals on a top surface, the apparatus comprises a test board comprising first pads on a predetermined surface; a socket configured to electrically connect the test object to the test board; and a handler configured to transport the test object to the socket. The socket comprises a first connection unit configured to be electrically connected to the first connection terminals of the test object and a second connection unit configured to be electrically connected to the second connection terminals of the test object.
Claims17
1-8. (canceled)
A socket for testing electric characteristics of a test object, the socket comprising:
- a first connection unit configured to be electrically connected to first connection terminals disposed on a bottom surface of the test object;
- and
- a second connection unit configured to be electrically connected to second connection terminals disposed on a top surface of the test object.
Dependencies are inferred from the claim text.