Semiconductor device contact structures and methods for making the same
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsShih Chieh CHANG, Chih-Chung CHANG, Kei-Wei CHEN, Ying-Lang WANG
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsShih Chieh CHANG, Chih-Chung CHANG, Kei-Wei CHEN, Ying-Lang WANG
Estimating the term…
A semiconductor contact structure and method provide contact structures that extend through a dielectric material and provide contact to multiple different subjacent materials including a silicide material and a non-silicide material such as doped silicon. The contact structures includes a lower composite layer formed using a multi-step ionized metal plasma (IMP) deposition operation. A lower IMP film is formed at a high AC bias power followed by the formation of an upper IMP film at a lower AC bias power. The composite layer may be formed of titanium. A further layer is formed as a liner over the composite layer and the liner layer may advantageously be formed using CVD and may be TiN. A conductive plug material such as tungsten or copper fills the contact openings.
A method for forming a contact structure in a semiconductor device, comprising:
A method for forming a tungsten contact in a semiconductor device comprising:
A semiconductor device contact structure comprising:
Dependencies are inferred from the claim text.