Method for detecting x-ray radiation and detector system with direct conversion detectors
AssigneeSiemens Aktiengesellschaft
InventorsEdgar Kraft, Daniel Niederlöhner, Christian Schröter
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Abstract
A method and a detector system are disclosed for the photon-counting detection of x-ray radiation with direct conversion detectors. In at least one embodiment of the method, as a function of the existing radiation energy, current and/or voltage pulses which are largely proportional thereto are generated, and the generated current and voltage pulses are counted in the detector when a predetermined current and/or voltage source is exceeded, whereby a threshold is used as a predetermined current and/or voltage threshold, which corresponds to a detection of a photon with an energy which is less than the k-edge of the detector material used.
Claims18
A method for photon-counting detection of x-ray radiation using at least one direct conversion detector, the method comprising:
- generating at least one of current and voltage pulses, which are largely proportional hereto, as a function of existing radiation energy;
- and
- counting the generated at least one of current and voltage pulses in the at least one detector upon at least one of a current and voltage threshold being exceeded, the threshold corresponding to a detection of a photon with an energy which is relatively less than a k-edge of detector material in the at least one detector.
A detector system for photon-counting detection of x-ray radiation, comprising:
- a plurality of direct conversion detector elements;
- and
- an evaluation electronics system configured to
- generate at least one of current and voltage pulses, which are largely proportional hereto, as a function of existing radiation energy, and
- count the generated at least one of current and voltage pulses in at least one of the detector elements upon at least one of a current and voltage threshold being exceeded, the threshold corresponding to a detection of a photon with an energy which is relatively less than a k-edge of detector material in the at least one detector element.
Dependencies are inferred from the claim text.