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AssigneeApple Inc.
InventorsJustin Gregg, Adil Syed, Vishwanath Venkataraman
Estimating the term…
A test station may include a test host, a signal generator, and a test chamber. Multiple devices under test (DUTs) may be placed in the test chamber during device characterization operations. Radio-frequency signals may be conveyed from the signal generator to the multiple DUTs using a radiated arrangement through an antenna in the test chamber. The signal generator may broadcast downlink test signals. The DUTs may synchronize with the downlink test signals and measure radio-frequency performance levels while receiving the downlink test signals. The test host may direct the signal generator to gradually lower its output power level. The DUTs may be used to determine downlink sensitivity by monitoring the measured radio-frequency performance levels as the output power level of the signal generator is lowered. Downlink sensitivity testing may be performed across any desired radio-frequency bands and channels.
A method of performing downlink sensitivity testing on a plurality of devices under test with a test station, wherein the test station includes a tester and a test chamber in which the plurality of devices under test are tested, the method comprising:
A method of testing a plurality of devices under test with a test station, wherein the plurality of devices under test are not electrically connected to the test station, the method comprising:
A radio-frequency test station with a test chamber in which a plurality of devices under test are tested, comprising:
Dependencies are inferred from the claim text.