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AssigneeOMRON Corporation
InventorsAkihiro Kawata, Tsuyoshi Sato, Takuya Hisaizumi
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An inspection system is provided that can efficiently perform the management of data obtained from a plurality of apparatuses. An inspection system includes inspection apparatuses to inspect products that are produced in a factory, and a management server that is connected via a communication line to the inspection apparatuses. The inspection apparatus includes an apparatus-side inspection result DB (database) 14a. The apparatus-side inspection result DB stores the inspection result data, which is data representing the result of inspecting a substrate with the inspection apparatus 11a. The apparatus-side inspection result DB is a key-value database that is constituted by keys and values.
An inspection system comprising a plurality of inspection apparatuses to inspect products, and a management server that is connected via a communication line to the inspection apparatuses,
A management server that can be connected via a communication line to a plurality of inspection apparatuses to inspect products, the management server comprising:
An inspection apparatus to inspect products, the inspection apparatus being connectable to a management server and comprising:
An inspection data management method comprising:
Dependencies are inferred from the claim text.