Patterned medium inspection method and inspection apparatus
OwnerTakuma NISHIMOTO, Masami Makuuchi +3inventors
InventorsTakuma NISHIMOTO, Masami Makuuchi, Yoshihiro Sakurai, Kunihito Higa, Fujio Onishi
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Abstract
A patterned medium inspection method according to the present invention includes a timing computation process including a read process reading the reproduced signal of a patterned medium under inspection and a computation process computing the signal interval values from the patterned medium reproduced signal read in the read process, and a judgment process judging the quality of the patterned medium using the reproduced signal interval values computed in the computation process.
Claims15
A patterned medium inspection method comprising:
- a read process reading a reproduced signal of a patterned medium under inspection;
- a computation process computing signal interval values from the reproduced signal of said patterned medium, read in said read process;
- and
- a judgment process judging a quality of said patterned medium using said signal interval values computed in said computation process.
A patterned medium inspection apparatus comprising:
- a magnetic head reading a reproduced signal of a patterned medium under inspection,
- a signal interval value computation means computing signal interval values from the reproduced signal of said patterned medium read by said magnetic head, and
- a judgment means judging a quality of said patterned medium using said signal interval values computed by said signal interval value computation means.
Dependencies are inferred from the claim text.