# US 2012/0186368 A1 · Method and device for cutting off one or more sample regions from a sample carrier

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- Number: US 2012/0186368 A1
- Document ID: US20120186368A1
- Status: Published application
- Kind: A1
- Application number: 13/295,439
- Filed: 2011-11-14
- Published: 2012-07-26
- Earliest claimed: 2011-01-21
- Assignees: Wallac Oy
- Inventors: Jussi Petteri LEHTONEN
- Web page: https://patentgrep.com/patent/US20120186368A1

## CPC

- G01N 1/286: {involving mechanical work, e.g. chopping, disintegrating, compacting, homogenising (microtomes G01N1/06; pulverising in general B02C; mixing in general B01F)}
- B01L 99/00: Subject matter not provided for in other groups of this subclass
- G01N 35/00: Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- H01T 23/00: Apparatus for generating ions to be introduced into non-enclosed gases, e.g. into the atmosphere
- H05F 3/04: by means of spark gaps or other discharge devices (devices providing for corona discharge per se H01T19/00)
- B01L 2300/021: Identification, e.g. bar codes
- B01L 2300/0816: Cards, e.g. flat sample carriers usually with flow in two horizontal directions
- B01L 2300/0829: Multi-well plates; Microtitration plates
- G01N 2001/288: {Filter punches}
- G01N 2035/00297: {Antistatic arrangements}
- H01T 19/04: having pointed electrodes
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)
- B01L: CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- H01T: SPARK GAPS; OVERVOLTAGE ARRESTERS USING SPARK GAPS; SPARKING PLUGS; CORONA DEVICES; GENERATING IONS TO BE INTRODUCED INTO NON-ENCLOSED GASES (overvoltage protection circuits H02H)
- H05F: STATIC ELECTRICITY; NATURALLY-OCCURRING ELECTRICITY

## Abstract

A device for cutting off one or more sample regions from a sample carrier that contains impregnated sample material, e.g. blood, is described. The device comprises: a cutting unit (101) for cutting off the one or more sample regions from the sample carrier, a support element (102) for supporting a sample well element (117) so that a sample well of the sample well element is able to receive each sample region cut off from the sample carrier, and an ionizer (103) for ionizing gas, e.g. air, that is, when the sample well element has been placed to the support element, in contact with the sample well element so as to discharge possible static electricity from the sample well element with the aid of the ionized gas. Therefore, the adverse effect of static electricity that can be present in the sample well element can be reduced or eliminated.

## Claims

### Claim 1

A device for cutting off one or more sample regions from a sample carrier that contains impregnated sample material, the device comprising:
a cutting unit for cutting off the one or more sample regions from the sample carrier,
a support element for supporting a sample well element so that the sample well element is able to receive the one or more sample regions cut off from the sample carrier, and
an ionizer for ionizing gas that is, when the sample well element has been placed to the support element, in contact with the sample well element so as to discharge static electricity from the sample well element.

### Claim 2 (depends on 1)

A device according to claim 1, wherein the device comprises a voltage source, a first electrical terminal of the voltage source being connected to the ionizer.

### Claim 3 (depends on 2)

A device according to claim 2, wherein the voltage source is an alternating voltage source and a second electrical terminal of the voltage source is connected to a body of the device.

### Claim 4 (depends on 2)

A device according claim 2, wherein the ionizer comprises two parts that are electrically insulated from each other and the first electrical terminal of the voltage source is connected to a first part of the ionizer and a second electrical terminal of the voltage source is connected to a second part of the ionizer.

### Claim 5 (depends on 2)

A device according to claim 2, wherein the voltage source is an alternating voltage source.

### Claim 6 (depends on 3)

A device according to claim 3, wherein the frequency of alternating voltage produced by the alternating voltage source is on the range 20-200 Hz, and the amplitude of the alternating voltage is on the range 2-10 kV.

### Claim 7 (depends on 4)

A device according to claim 4, wherein the voltage source is a direct voltage source.

### Claim 8 (depends on 1)

A device according to claim 1, wherein the ionizer comprises a plurality of sharpened spikes so as to maximize the peak value of electrical field strength in the vicinity of the ionizer.

### Claim 9 (depends on 8)

A device according to claim 8, wherein the spikes of the ionizer are directed so that, when the sample well element is in its normal operation position in the support element, the spikes are towards openings of the sample wells of the sample well element.

### Claim 10 (depends on 9)

A device according to claim 9, wherein a distance from tips of the spikes to a spatial plane that co-insides with a bottom of the sample well element, when the sample well element is in its normal operation position in the support element, is on the range 10-15 mm.

### Claim 11 (depends on 1)

A device according to claim 1, wherein the ionizer comprises elongated electrical conductors mechanically supported by a support made of electrically non-conductive material, and a total area of the electrical conductors is at most a tenth of an area of a smallest closed spatial surface capable of enclosing the ionizer so as to minimize capacitance between the ionizer and other parts of the device.

### Claim 12 (depends on 8)

A device according to claim 8, wherein the spikes are mechanically supported with a support made of electrically insulating material so as to minimize capacitance between the ionizer and other parts of the device.

### Claim 13 (depends on 11)

A device according to claim 11, wherein the support made of the electrically insulating material is provided with holes and/or cuts in order to decrease a surface area of the support so as to minimize capacitance between the support and other parts of the device.

### Claim 14 (depends on 1)

A device according to claim 1, wherein the cutting unit comprises a punch and a die provided with a channel for the punch, the punch being arranged to cut off each sample region with a stroke through the sample carrier.

### Claim 15 (depends on 1)

A device according to claim 1, wherein the cutting unit comprises a cutting instrument for producing a point-form cut on the sample carrier and equipment for directing the cutting instrument so that cutting impact produced by the cutting instrument is moved along the outer periphery of each sample region so as to cut off the sample region.

### Claim 16

A method for cutting off one or more sample regions from a sample carrier that contains impregnated sample material, the method comprising:
cutting off the one or more sample regions from the sample carrier,
receiving the one or more sample regions cut off from the sample carrier at a sample well element, and
prior to cutting off the one or more sample regions, ionizing gas that is in contact with the sample well element using an ionizer in order to discharge static electricity from the sample well element.

### Claim 17 (depends on 16)

A method according to claim 16, wherein alternating voltage is connected between the ionizer and a body structure of a device comprising the ionizer.

### Claim 18 (depends on 16)

A method according claim 16, wherein the ionizer comprises two parts that are electrically insulated from each other and alternating voltage is connected between the two parts of the ionizer.

### Claim 19 (depends on 17)

A method according to claim 17, wherein the frequency of the alternating voltage is on the range 20-200 Hz, and the amplitude of the alternating voltage is on the range 2-10 kV.

### Claim 20 (depends on 16)

A method according claim 16, wherein the ionizer comprises two parts that are electrically insulated from each other and direct voltage is connected between the two parts of the ionizer.

### Claim 21 (depends on 16)

A method according to claim 16, wherein the ionizer comprises a plurality of sharpened spikes so as to maximize the peak value of electrical field strength in the vicinity of the ionizer.

### Claim 22 (depends on 21)

A method according to claim 21, wherein the spikes of the ionizer are directed towards openings of the sample wells of the sample well element.

### Claim 23 (depends on 22)

A method according to claim 22, wherein a distance from tips of the spikes to the openings of the sample wells of the sample well element is on the range 1-6 mm.

### Claim 24 (depends on 21)

A method according to claim 21, wherein the spikes are supported with a support made of electrically insulating material so as to minimize capacitance between the ionizer and other parts of the device comprising the ionizer.

### Claim 25 (depends on 24)

A method according to claim 24, wherein the support made of the electrically insulating material is provided with holes and/or cuts in order to decrease a surface area of the support so as to minimize capacitance between the support and other parts of the device.

### Claim 26 (depends on 16)

A method according to claim 16, wherein the one or more sample regions are cut off with a punch and a die provided with a channel for the punch, the punch being capable of cutting off each sample region with a stroke through the sample carrier.

### Claim 27 (depends on 16)

A method according to claim 16, wherein the method comprises moving a point-form cutting impact produced by a cutting instrument along the outer periphery of each sample region so as to cut off the sample region from the sample carrier.
