Thermal Analysis Apparatus And Thermal Analysis Method
AssigneeNetzsch-Gerätebau GmbH
InventorsAlexander Schindler, Juergen Blumm
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Abstract
A thermal analysis apparatus and method, including a sample space with a sample carrier, and heating devices, and an inert gas. Flow devices generate an inert gas flow to the sample carrier. Getter devices and/or oxygen traps disposed in the inert gas flow remove residual oxygen.
Claims20
A thermal analysis apparatus with a sample space, in which a sample carrier and heating devices as well as flow devices with an inert gas supply for an inert gas are contained, characterised in that at least one getter device for the removal of residual oxygen from the inert gas is contained, wherein the one getter device is disposed in the inert gas flow in the flow direction upstream of the sample carrier in the vicinity thereof and the getter device) comprises at least one getter carrier for receiving a getter material, wherein the getter carrier and/or the getter material are disposed axially with respect to the sample carrier, and that the getter carrier can be produced from a ceramic material.
A thermal analysis method, wherein a sample carrier and heating devices are surrounded by inert gas in a sample space, wherein an inert gas flow is generated by an inert gas supply in the sample space, characterised in that
- the inert gas flow in the sample space first flows over or past the getter devices for the removal of residual oxygen from the inert gas and then to the sample carrier,
- the getter devices are disposed in the vicinity of the sample carrier,
- at least one getter carrier for receiving a getter material is disposed in the getter device, wherein the getter carrier and/or the getter material are aligned axially with the sample carrier, and
- the getter carrier is produced from a ceramic material.
Dependencies are inferred from the claim text.