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US 2012/0072615 A1Published application
Programmable Management IO Pads for an Integrated Circuit
AssigneeBroadcom Corporation
InventorsHoang T. Tran, Howard A. Baumer
Life of this patent
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Abstract
A method for performing Iddq testing including receiving an Iddq message and executing the Iddq message to measure current leakage.
Claims2
A method for performing Iddq testing, comprising:
- receiving, at a logic circuit coupled to a programmable pad, an Iddq message;
- receiving, at a controller, the Iddq message, the controller being one of an input controller and an output controller;
- and
- executing, at the logic circuit, the Iddq message to measure current leakage.
1 more element
A system for performing Iddq testing, comprising:
- a programmable pad;
- a logic circuit coupled to the programmable pad and configured to receive an Iddq message and to execute the Iddq message to measure current leakage;
- and
- a controller configured to receive the Iddq message, the controller being one of an input controller and an output controller.
1 more element
Dependencies are inferred from the claim text.