Test method and system for testing image processor of electronic device

A test system for testing an image processor of an electronic device by controlling the image processor to playback a test image divided into several pixel areas, each pixel area comprising several rows of pixels, and pixel values of the rows of pixels of one pixel area being respectively the same, the test system comprising:

• a storage device storing test data by recording pixel value of one row of each of pixel areas, and positions of the pixel areas, of the test image;
• a test module comprising:
• an invoking sub-module, configured to invoke the test data from the storage device when the electronic device connects to the storage device;
• an image building sub-module, configured to form the test image by respectively building the each pixel areas at the corresponding positions according to the test data;
• and
• a test controlling sub-module, configured to control the image processor to produce an image signal corresponding to the test image;
• and
• a test device, configured to receive the image signal outputted by the image processor and judge the quality of the image processor according to the image signal.