Technique for determining performance characteristics of electronic devices and systems
AssigneeRambus Inc.
InventorsHaw-Jyh LIAW, Xingchao Yuan, Mark A. Horowitz
Life of this patent
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AssigneeRambus Inc.
InventorsHaw-Jyh LIAW, Xingchao Yuan, Mark A. Horowitz
Estimating the term…
A technique for determining performance characteristics of electronic devices and systems is disclosed. In one embodiment, the technique is realized by measuring a first response on a first transmission line from a single pulse transmitted on the first transmission line, and then measuring a second response on the first transmission line from a single pulse transmitted on at least one second transmission line, wherein the at least one second transmission line is substantially adjacent to the first transmission line. The worst case bit sequences for transmission on the first transmission line and the at least one second transmission line are then determined based upon the first response and the second response for determining performance characteristics associated with the first transmission line.
1-18. (canceled)
An apparatus for determining a performance characteristic of an integrated circuit in a signaling system, the integrated circuit having a transmitter, the apparatus to couple to the integrated circuit via a first transmission line, the apparatus comprising:
An apparatus for determining a performance characteristic of an integrated circuit in a signaling system, the integrated circuit having a transmitter, the apparatus to couple to the integrated circuit via a first transmission line, the apparatus comprising:
An apparatus for determining a performance characteristic of an integrated circuit in a signaling system, the integrated circuit having at least two data transmitters, the apparatus to couple to the at least two data transmitters via respective transmission lines, the apparatus comprising:
Dependencies are inferred from the claim text.