Voltage drop analysis apparatus, voltage drop analysis method, and system

A voltage drop analysis method which analyzes voltage drops of an element included in a semiconductor integrated circuit, the voltage drop analysis method comprising:

• analyzing currents flowing through the element by a current analysis unit on the basis of operation scenario information which prescribes transitions of an input signal and an output signal of the element, input signal transition time information which prescribes the transition time of the input signal of the element, signal interconnection load information which prescribes resistance values and capacitance values of signal interconnections connected to the element, and cell current dissipation information which prescribes relations among the operation scenario information, the input signal transition time information, the signal interconnection load information, and currents flowing through the element, and outputting current information concerning currents flowing through the element by the current analysis unit;
• analyzing voltage drops of the element by a voltage drop analysis unit on the basis of the current information and circuit layout information including information concerning connection of the element, arrangement of the element and power supply interconnection connected to the element, and which outputting voltage drop information concerning voltage drops of the element by the voltage drop analysis unit;
• selecting corner information of the element from a corner information list containing a plurality of pieces of corner information by a corner selection unit;
• and
• outputting post correction voltage drop information obtained by correcting the voltage drop information by a voltage drop correction unit on the basis of the voltage drop information, the selected corner information, and the voltage drop correction information prescribing relations between the corner information and correction quantities of the voltage drop information.

A system comprising:

• an input device which inputs a command given by a user;
• and
• a voltage drop analysis apparatus which analyzes voltage drops of an element included in a semiconductor integrated circuit of analysis object and which outputs total voltage drop information, in response to the command,
• wherein the voltage drop analysis apparatus comprises:
• a current analysis unit which analyzes currents flowing through the element on the basis of operation scenario information which prescribes transitions of an input signal and an output signal of the element, input signal transition time information which prescribes the transition time of the input signal of the element, signal interconnection load information which prescribes resistance values and capacitance values of signal interconnections connected to the element, and cell current dissipation information which prescribes relations among the operation scenario information, the input signal transition time information, the signal interconnection load information, and currents flowing through the element, and which outputs current information concerning currents flowing through the element;
• a voltage drop analysis unit which analyzes voltage drops of the element on the basis of the current information and circuit layout information including information concerning connection of the element, arrangement of the element and power supply interconnection connected to the element, and which outputs voltage drop information concerning voltage drops of the element;
• a corner selection unit which selects corner information of the element from a corner information list containing a plurality of pieces of corner information;
• and
• a voltage drop correction unit which outputs post correction voltage drop information obtained by correcting the voltage drop information on the basis of the voltage drop information, the selected corner information, and the voltage drop correction information prescribing relations between the corner information and correction quantities of the voltage drop information.