Method of Manufacturing a Semiconductor Device
OwnerJae-Man Yoon, Yong-Chul Oh +3inventors
InventorsJae-Man Yoon, Yong-Chul Oh, Hui-Jung Kim, Hyun-Woo Chung, Kang-Uk Kim
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OwnerJae-Man Yoon, Yong-Chul Oh +3inventors
InventorsJae-Man Yoon, Yong-Chul Oh, Hui-Jung Kim, Hyun-Woo Chung, Kang-Uk Kim
Estimating the term…
A semiconductor device includes a substrate having a first area and a second area, a first active structure disposed in the first area, a second active structure disposed in the second area, a first transistor disposed in the first area and a second transistor disposed in the second area. The second active structure may have a height substantially the same as a height of the first active structure. The first transistor includes a first gate structure enclosing an upper portion of the first active structure, a first impurity region formed at a lower portion of the first active structure, and a second impurity region formed at the upper portion of the first active structure. The second transistor includes a second gate structure formed on the second active structure and third impurity regions formed at an upper portion of the second active structure.
-12. (canceled)
A method of manufacturing a semiconductor device, comprising:
Dependencies are inferred from the claim text.