Compensating for non-ideal multi-core optical fiber structure
AssigneeLuna Innovations Incorporated
InventorsJustin W. KLEIN, Mark E. FROGGATT, Stephen T. KREGER, Dawn K. GIFFORD, Sandra M. KLUTE
Life of this patent
Estimating the term…
Loading patent…
AssigneeLuna Innovations Incorporated
InventorsJustin W. KLEIN, Mark E. FROGGATT, Stephen T. KREGER, Dawn K. GIFFORD, Sandra M. KLUTE
Estimating the term…
An interferometric measurement system includes a spun optical fiber including multiple optical waveguides configured in the fiber. Interferometric detection circuitry detects measurement interferometric pattern data associated with each of the multiple optical waveguides when the optical fiber is placed into a bend. Data processing circuitry determines compensation parameters that compensate for variations between an optimal configuration of the multiple optical waveguides in the fiber and an actual configuration of multiple optical waveguides in the fiber. The compensation parameters are stored in memory for compensating subsequently-obtained measurement interferometric pattern data for the fiber. The compensation parameters are applied to the subsequently-obtained measurement interferometric pattern data in order to distinguish between axial strain, bend strain, and twist strain on the fiber and to accurately determine one or more strain values for the fiber corresponding to one or more of the axial strain, bend strain, or twist strain on the fiber.
An interferometric measurement system for measuring a spun optical fiber including multiple optical waveguides configured in the fiber, comprising:
An interferometric measurement system, comprising:
A non-transitory, computer-readable storage medium for use in an interferometric measurement system for measuring a spun optical fiber including multiple optical waveguides configured in the fiber, the non-transitory, computer-readable storage medium storing a computer program comprising instructions that provide a computer-based interferometric measurement system with compensation parameter information that compensates for variations between an optimal configuration of the multiple optical waveguides in the spun optical fiber and an actual configuration of multiple optical waveguides in the spun optical fiber determined based on detected measurement interferometric pattern data for the spun optical fiber positioned in a bend.
An interferometric measurement method for measuring a spun optical fiber including multiple optical waveguides configured in the fiber, comprising:
Dependencies are inferred from the claim text.