Cell substrate inspection system and method
AssigneeKabushiki Kaisha Toshiba
InventorsTakashi MIYAUCHI, Kentaro Miyazaki
Life of this patent
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Abstract
According to one embodiment, the system for inspecting a cell substrate is provided. The inspection system includes: a signal generator transmitting to a cell substrate a display signal causing the cell substrate to display a test image; an imaging apparatus capturing the test image displayed on the cell substrate; a parallax image generator arranging the set of parallax image information of the captured test image for each parallax image to generate a parallax image prediction of parallax image which is obtained when the cell substrate is bonded to the lenticular lens; and an interface apparatus displaying the parallax image predictions.
Claims5
A system for inspecting a cell substrate which is bonded to a lenticular lens for use in an integral-imaging three-dimensional image display apparatus and includes a display region having an array of a plurality of sub-regions, each sub-region displaying a set of parallax image information obtained by dividing each of a plurality of parallax images, the system for inspecting the cell substrate comprising:
- a signal generator configured to transmit to the cell substrate a display signal causing the cell substrate as an inspection object to display a test image;
- an imaging apparatus configured to capture the test image displayed on the cell substrate receiving the display signal;
- a parallax image generator configured to arrange the set of parallax image information of the captured test image for each parallax image and generate a parallax image prediction of the parallax image which can be obtained when the lenticular lens is bonded to the cell substrate;
- and
- an interface apparatus configured to display the parallax image prediction.
A system for inspecting a cell substrate which is bonded to a lenticular lens for use in an integral-imaging three-dimensional image display apparatus and includes a display region having an array of a plurality of sub-regions, each sub-region displaying a set of parallax image information obtained by dividing each of a plurality of parallax images, the system for inspecting the cell substrate comprising:
- a signal generator configured to transmit to the cell substrate a display signal causing the cell substrate as an inspection object to display a test image;
- an imaging apparatus configured to capture the test image displayed on the cell substrate receiving the display signal;
- a parallax image generator configured to arrange the set of parallax image information of the captured test image for each parallax image and generate a parallax image prediction of the parallax image which can be obtained when the lenticular lens is bonded to the cell substrate;
- and
- a determination apparatus configured to analyze the parallax image prediction to determine the presence of a defect in the cell substrate.
A method for inspecting a cell substrate which is bonded to a lenticular lens for use in an integral-imaging three-dimensional image display apparatus and includes a display region having an array of a plurality of sub-regions, each sub-region displaying a set of parallax image information obtained by dividing each of a plurality of parallax images, the method comprising:
- causing the cell substrate as an inspection object to display a test image;
- capturing the test image displayed on the cell substrate;
- arranging the sets of parallax image information of the captured test image for each parallax image to generate a parallax image prediction of the parallax image which can be obtained when the lenticular lens is bonded to the cell substrate;
- and
- analyzing the parallax image prediction to determine the presence of a defect of the cell substrate.
Dependencies are inferred from the claim text.