Method for determining the parameters of a photovoltaic device

A method for determining the parameters of a photovoltaic device having at least one multi-junction solar cell which consists of at least two subcells layered on top of one another and connected electrically and optically in series, each having a p-conductive layer, an intrinsic layer and an n-conductive layer, wherein for each subcell of the at least two subcells of the at least one multi-junction solar cell of the photovoltaic device to be examined, a reference cell is produced, which comprises at least two subcells, wherein the one subcell of each reference cell corresponds to one subcell of the at least two subcells of the at least one multi-junction solar cell of the photovoltaic device to be examined, whereas the at least one further subcell of each reference cell has at least one layer which corresponds to the intrinsic layer of the at least one further subcell of the at least one multi-junction solar cell of the photovoltaic device to be examined, but which is converted into an electrically conductive layer by doping, the method comprising:

• the spectral sensitivity of the reference cells is measured, and
• for determining the parameters of the at least one multi-junction solar cell, the parameters of the reference cells and the parameters of the at least one multi-junction solar cell are measured by means of a solar simulator calibrated to the reference cells under the same conditions.