Electrical test probe and probe assembly
AssigneeKabushiki Kaisha Nihon Micronics
InventorsTakayuki HAYASHIZAKI, Akira SOMA, Hideki HIRAKAWA
Life of this patent
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Abstract
An embodiment disperses a force acting on a border portion between an extending portion and a pedestal portion or a reinforcing member to prevent breakage of a probe tip portion of a probe. An electrical test probe includes a probe main body, a recess provided at an end of the main body and having an inner surface, and a probe tip having a part received in the recess. The inner surface has a central area and two lateral areas on both sides of the central area, and the part of the probe tip is located at the central area and at least at either one of the lateral areas.
Claims10
A probe, comprising:
- a probe main body portion;
- a recess provided at an end of the probe main body portion and having an inner surface;
- and
- a probe tip portion having a part received in the recess,
- wherein the inner surface has a central area and two lateral areas on both sides of the central area, and the part of the probe tip portion is located at the central area and at least at either one of the lateral areas.
A probe assembly, comprising:
- a plurality of probes wherein each probe has a probe main body portion, a recess provided at an end of the probe main body portion and having an inner surface, and a probe tip portion having a part received in the recess and wherein the inner surface has a central area and two lateral areas on both sides of the central area, and the part of the probe tip portion is located at the central area and at least at either one of the lateral areas;
- and
- a probe board to which the probes are attached.
An electrical test probe, comprising:
- a probe main body portion;
- a plate-like pedestal portion that is provided at the probe main body portion and whose right-left direction is a thickness direction;
- and
- a probe tip portion that extends downward from the pedestal portion and whose lower end is a tip end to contact on a device under test,
- wherein the pedestal portion has a recess opened at least downward and defined by a central area opposed to an open surface thereof and lateral areas continuing into respective ends of the central area in a front-back direction and reaching open ends of the recess from the central area,
- wherein the probe tip portion is made of a harder material than that of the pedestal portion and has a coupling portion coupled with the pedestal portion by being buried or fitted in the pedestal portion and a plate-like extending portion extending downward from the recess and having a smaller thickness dimension than a thickness dimension of the recess, and
- wherein the extending portion has a border portion contacting the recess from the central area to the respective lateral areas and the tip end.
Dependencies are inferred from the claim text.