Apparatus and method for detecting defect using multiple phase selectable pulsed eddy current
OwnerDong Man Suh, Seung Kee Chea +2inventors
InventorsDong Man Suh, Seung Kee Chea, Dong Seob Suh, Min Seok Seo
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OwnerDong Man Suh, Seung Kee Chea +2inventors
InventorsDong Man Suh, Seung Kee Chea, Dong Seob Suh, Min Seok Seo
Estimating the term…
There is provided a apparatus and method for detecting defect using multiple phase selectable pulsed eddy current (PEC), comprising: an object to be determined as to presence of a defect; a PEC irradiation unit positioned close to a surface of the object, that irradiates a PEC signal to the object and receives a defect or defect-free signal reflected from the object as a result of irradiation; a measurement unit connected to the PEC irradiation unit by a cable, being input with the reflected PEC signal received in the PEC irradiation unit, and stored with a program for time-sharing and displaying the PEC signal on a graph, that processes a resultant value to be displayed; a display unit connected to the measurement unit, that displays the resultant value being output from the measurement unit; and an input unit connected to the measurement unit, that sets a phase (a multiple phase selectable value through selecting an arbitrary location by time-sharing the measured PEC signal), frequency (a frequency value of the input PEC signal) and gain (a time axis range of the reflected PEC signal) of the PEC signal irradiated to the object.
An apparatus for detecting defect using multiple phase selectable pulsed eddy current (PEC) comprising:
A method for detecting defect using multiple phase selectable pulsed eddy current (PEC), the method comprising:
Dependencies are inferred from the claim text.