Metal can impedance control structure
AssigneeTessera Research LLC
InventorsBelgacem Haba, Ellis Chau, Wael Zohni, Richard Dewitt Crisp
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AssigneeTessera Research LLC
InventorsBelgacem Haba, Ellis Chau, Wael Zohni, Richard Dewitt Crisp
Estimating the term…
A microelectronic assembly includes an interconnection element, element contacts, first and second metal layers, conductive elements, and first and second microelectronic devices. The first metal layer may extend beyond at least one of the edges of the first microelectronic device. The conductive elements may respectively extend beyond at least one of the edges of the first metal layer. The first metal layer may have a surface disposed at a substantially uniform spacing from at least substantial portions of the conductive elements, such that a desired impedance may be achieved for the conductive elements. The conductive elements may be spaced a smaller distance from the metal layer than the distance of the conductive elements from the front surface of the first microelectronic device. The second metal layer may be connectable to a source of reference potential.
A microelectronic assembly comprising:
A microelectronic assembly comprising:
A method of manufacturing a microelectronic assembly comprising:
A microelectronic assembly comprising:
A microelectronic assembly comprising:
Dependencies are inferred from the claim text.