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AssigneeLSI Corporation
InventorsJoshua Alan Johnson, Robert W. Warren, JR., Kyle L. Nelson
Estimating the term…
Disclosed is a method and apparatus for testing devices that will be connected to a computer storage media device by generating a complex test waveform that emulates operation of the computer storage media device using at least one Graphics Processing Unit (GPU) and applying the generated complex test waveform to the device(s) being tested. The complex test waveform may be generated by calculating a plurality of discrete individual portions of the complex test waveform in parallel, in real-time, and continuously using the parallel processing features of the GPU(s). The discrete individual portions of the complex test waveform may be representative of various characteristics of the emulated computer storage media device operation such as operational characteristics of the computer storage media device, environmental effects on the computer storage media device, application of filters to the computer storage media device signal, etc. Various embodiments may generate the base data signal waveform from the emulated computer storage device such that the entire complex test waveform is calculated. Other embodiments may use a pre-existing base data signal waveform provided from another source and modify/alter the pre-existing base data signal waveform to generate the complex test waveform. When available, one or more Central Processing Units (CPUs) and/or CPU cores may also perform calculations in parallel with the calculations performed by the GPU(s).
A method to test, in real-time, at least one test device that is a device intended to interact with a computer storage media device comprising:
A test apparatus for testing, in real-time, at least one device that is intended to interact with a computer storage media device comprising:
The test apparatus of claim 15 wherein at least one discrete individual portion of said plurality of discrete individual portions of said complex test waveform has at least one adjustable parameter that varies results of said at least one discrete individual portion of said plurality of discrete individual portions of said complex test waveform, and said test apparatus of claim 16 further comprises a parameter adjustment subsystem that adjusts said at least one adjustable parameter in real-time such that said complete complex test waveform emulating said computer storage media device changes in accord with said at least one adjustable parameter.
Dependencies are inferred from the claim text.