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US 2012/0060058 A1Published application
Testing of non stuck-at faults in memory
AssigneeSTMicroelectronics Pvt. Ltd.
InventorSuraj PRAKASH
Life of this patent
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Abstract
A method for identifying non stuck-at faults in a read-only memory (ROM) includes generating a golden value of a victim cell, providing a fault-specific pattern through an aggressor cell, generating a test reading of the victim cell in response to the provided fault-specific pattern, and determining whether the ROM has at least one non stuck-at fault. The determination is based on a comparison of the golden value and the test reading of the victim cell.
Claims20
A method for testing a read-only memory (ROM) for at least one non stuck-at fault, the method comprising:
- generating a golden value of a victim cell, wherein the golden value corresponds to an uncorrupted data value of the victim cell;
- providing a fault-specific pattern through an aggressor cell, wherein the aggressor cell is associated with a plurality of victim cells;
- generating a test reading of the victim cell in response to the provided fault-specific pattern;
- and
- determining whether the ROM has at least one non stuck-at fault based on a comparison of the golden value and the test reading of the victim cell.
2 more elements
A system-on-chip (SOC) comprising:
- a read-only memory (ROM);
- and
- a built-in self test (BIST) unit coupled to the ROM, the BIST unit comprising,
- a golden value generator configured to,
- provide a golden value of a victim cell;
- provide a fault-specific pattern through an aggressor cell, wherein the aggressor cell is associated with at least one victim cell;
- and
- generate a test reading of the victim cell in response to the fault-specific pattern;
- and
- a fault identification module configured to identify non stuck-at faults in the ROM based at least on the golden value and the test reading of the victim cell.
7 more elements
Dependencies are inferred from the claim text.