Method and device for determining reflection coefficients on filter arrangements having thin layers

A method for determining optical properties by measuring intensities on a thin layer, comprising the steps of:

• irradiating an at least partially transparent carrier having at least one thin layer with incident light,
• measuring interferences on the at least one thin layer as a relative intensity of at least one superpositioned wave, and
• subsequently determining a reflection and/or transmission coefficient from at least one of a reflection and a transmission on the at least one thin layer.

A device for determining optical properties by measuring intensities on a thin layer, comprising:

• at least one light source emitting light at least in a narrow wavelength range which is directly adjusted to an at least partially transparent carrier having the thin layer and irradiates at least a partial region of the thin layer,
• at least one detector cooperating with at least one reference detector, for at least one of spatially or time-resolved measurement of light intensities in the at least one irradiated partial region, and
• an evaluation unit comprising at least one stored lookup table.