Stripe pattern image analysis device, stripe pattern image analysis method, and program thereof
AssigneesNEC Soft, Ltd., NEC Corporation
InventorsMasanori HARA, Hiroaki TOYAMA
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AssigneesNEC Soft, Ltd., NEC Corporation
InventorsMasanori HARA, Hiroaki TOYAMA
Estimating the term…
Provided is a stripe pattern image analysis device by which a burden of an appraiser regarding a new charting point searching designation operation can be reduced. The device includes a charting point modification element obtaining or modifying a first point located on a first stripe pattern image displayed in a first window, and a second point which is corresponding to the first point and located on a second stripe pattern image displayed in a second window; a nonlinear coordinate transformation element transforming the first stripe pattern image using a nonlinear coordinate transformation so that a first coordinate of the first point in the first window matches a second coordinate of the second point in the second window; and a charting figure edit and display element displaying the first stripe pattern image, transformed by the nonlinear coordinate transformation element by use of the nonlinear coordinate transformation, in the first window.
A stripe pattern image analysis device, comprising:
A stripe pattern image analysis method, comprising:
A non-transient computer readable media on which a program is stored wherein the program makes a computer execute:
Dependencies are inferred from the claim text.