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US 2012/0056682 A1Published application
Semiconductor integrated circuit device and oscillation frequency calibration method
AssigneeKabushiki Kaisha Toshiba
InventorsYuji SATOH, Mototsugu HAMADA, Daisuke MIYASHITA
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Abstract
A semiconductor integrated circuit device includes a DCO and a storing unit that stores a temperature coefficient of an oscillation frequency and an absolute value of the oscillation frequency, which should be set in the DCO, corresponding to potential obtained from a voltage source that changes with a monotonic characteristic with respect to temperature.
Claims14
A semiconductor integrated circuit device comprising:
- an oscillator;
- and
- an oscillation-frequency calibrator configured to transmit a control signal for controlling the oscillator, based on information for determining an oscillation frequency of the oscillator and potential information from a voltage source configured to fluctuate with a monotonic characteristic with respect to temperature.
An oscillation frequency calibration method for calibrating an oscillation frequency of an oscillator, comprising:
- generating a control signal based on information for determining an oscillation frequency of the oscillator and potential information from a voltage source configured to fluctuate with a monotonic characteristic with respect to temperature;
- and
- controlling the oscillator with the control signal.
Dependencies are inferred from the claim text.