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US 2012/0012018 A1Published application
Reflection densitometer
AssigneeHewlett-Packard Development Company, L.P.
InventorsHenryk Birecki, William D. Holland, Omer Gila
Life of this patent
Estimating the term…
Abstract
A method for determining optical density is disclosed. A first measurement is taken on a white area of a substrate (402). A second measurement is taken on an area of the substrate printed with ink (404). A relative optical density of the ink is determined using the first and second measurements (406).
Claims13
A method, comprising:
- making a first optical density (OD) measurement on a white area of a substrate;
- making a second OD measurement on an area of the substrate printed with ink;
- determining a relative OD of the ink using the first and second measurements,
- determining an absolute OD of the ink by adding the relative OD of the ink to an absolute OD of the substrate.
1 more element
A apparatus, comprising:
- at least one illumination source;
- illumination optics positioned to direct light from the at least one illumination source onto a target area;
- a detector positioned to collect light from the target area;
- detector optics positioned to focus light from the target area onto the detector;
- a controller coupled to the at least one illumination source and the detector and configured to control the at least one illumination source and the detector, the controller configured to take a first OD measurement when a white area of an object is in the target area and a second OD measurement when an area of the object printed with ink is in the target area, the controller configured to calculate a relative OD of the ink using the first and second measurements and the controller configured to calculate an absolute optical density of the ink by adding the relative optical density of the ink to an absolute OD of the target.
2 more elements
Dependencies are inferred from the claim text.