Test system and high voltage measurement method
AssigneeSamsung Electronics Co., Ltd.
InventorsPyung-Moon ZHANG, Jin-Yub LEE
Life of this patent
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Abstract
Provided are a test system and a related high voltage measurement method. The method includes applying an external voltage signal to one or more of a plurality of DUTs via the shared channel, comparing the external voltage signal with a high voltage signal internally generated by the one or more DUTs and generating a corresponding comparison result, and determining a voltage level for each respective high voltage signal in accordance with the comparison result.
Claims20
A flash memory device, comprising:
- a voltage divider connected between a first node applied an external voltage signal and a ground configured to provide a division voltage distributed the external voltage signal at a second node;
- a comparator configured to compare the division voltage with a reference voltage, and to generate a comparison result;
- a storage unit configured to store data corresponding to the comparison result;
- and
- a data output block configured to output the stored data.
A method for operating of in a flash memory device, comprising:
- receiving an incremental or decremental external voltage signal in flash memory devices, respectively;
- comparing a division voltage distributed the external voltage signal by a voltage divider with a reference voltage to generate a comparison result in the flash memory devices, respectively;
- storing data corresponding to the comparison result when the comparison result toggles from one state to another state in the flash memory devices, respectively;
- and
- outputting the stored data in accordance with a data output command in the flash memory devices, respectively.
A method for operating of a flash memory device, comprising:
- receiving an external voltage signal;
- transferring the received external voltage signal to a voltage divider in accordance with an external voltage signal application command;
- comparing a division voltage distributed the external voltage signal by the voltage divider with a reference voltage to generate a comparison result;
- storing data corresponding to the comparison result;
- and
- outputting the store data in accordance with a data output command.
Dependencies are inferred from the claim text.