Row bar and wafer

Abstract

A row bar having a plurality of slider forming areas collocated and slider cutting areas formed between two adjacent slider forming areas respectively, the slider forming areas are eventually cut into individual sliders along the slider cutting areas respectively, each slider having a pole tip embedded therein and an air bearing surface pattern on an air bearing surface facing to a disk, and at least a regular measuring pattern with straight line is formed on one of the slider cutting areas, to serve as a frame of reference for measuring the position of the pole tip and the air bearing surface pattern. The present invention can improve the measuring accuracy, decrease the measuring error and, in turn, improve the performance of the slider.

Dependencies are inferred from the claim text.