Active barrier to foreign particle deposition on a device surface via vibrations

Abstract

To prevent foreign particles from adhering to an external surface of an electronic device and adversely affecting a user's enjoyment of the device, and to remove adhered foreign particles, a source of mechanical waves can be incorporated within the device. The source can provide mechanical waves tuned to prevent foreign particles from adhering, or to remove foreign particles adhered to the external surface of the device, for example by increasing the contact angle between the foreign particles and the outer component. In some cases, the electronic device can dynamically tune, modify, or adjust emitted waves to direct foreign particles towards particular regions of the device, or to provide waves better adapted at removing different types of particles. In some embodiments, the electronic device can include a reservoir for receiving and holding foreign particles until they are removed from the device.

Dependencies are inferred from the claim text.