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US 2011/0255338 A1Published application
Flash memory device and system including the same
AssigneeSamsung Electronics Co., Ltd.
InventorsJong-Hwa Kim, Young-Joon Choi, Seok-Cheon Kwon
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Abstract
The invention provides an operation method of a memory system including a flash memory device. The method includes programming at least one page included in a selected memory block of the flash memory device; and determining the selected memory block or the flash memory device to be invalid, according to whether a loop number of the programmed page is out of a reference loop range.
Claims21
A method of operating a nonvolatile memory device, the method comprising:
- repetitively programming at least one page included in a selected memory block of the nonvolatile memory device until a program pass;
- reading a loop number of the programmed page from the nonvolatile memory device;
- comparing the read loop number with a particular value;
- and
- determining the selected memory block of the nonvolatile memory device to be invalid according to the comparison result.
2 more elements
A nonvolatile memory device comprising:
- a memory cell array including a plurality of memory blocks, each of the plurality memory blocks having a plurality of pages;
- a read/write circuit configured to repetitively program a selected page among a selected memory block until a program pass;
- and
- a control logic configured to control the read/write circuit and count a loop number of the programmed page,
- wherein the memory cell array configures to store reference loop information which is based on wear-level information of the memory cell array, and the selected memory block is determined to be invalid according to a result of comparing the counted loop number with the reference loop information.
2 more elements
A nonvolatile memory system comprising:
- a nonvolatile memory device including a plurality of memory blocks, each of the plurality of memory blocks having a plurality of pages;
- and
- a memory controller configured to manage wear-leveling information of the nonvolatile memory device, and generate reference loop information according to the wear-leveling information, wherein
- the nonvolatile memory device is configured to program a selected page in a selected memory block and provide a loop number of the programmed page to the memory controller, according to a control of the memory controller, and
- the memory controller is configured to compare the loop number with the reference loop information and determine the selected memory block to be invalid according to the comparison result.
2 more elements
Dependencies are inferred from the claim text.