Metrology of thin film devices using an addressable micromirror array
AssigneeApplied Materials, Inc.
InventorsEdgar Genio, Edward W. Budiarto
Life of this patent
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Abstract
An addressable micromirror array is employed in conjunction with circuit topology navigation software to rapidly wavelength sample selected measurement points in an integrated circuit region.
Claims19
A method of performing a measurement at a selected location or point on the surface of a semiconductor wafer having thin film features formed in accordance with an integrated circuit design, comprising:
- identifying a region of the workpiece surface containing the selected location;
- acquiring a two-dimensional spatial image of said region;
- processing said spatial image of said region with reference to said integrated circuit design and with reference to said selected location, to determine at least one pixel of said spatial image containing or adjacent said selected location;
- focusing an addressable micromirror array onto said region whereby individual micromirrors of said array receive light from corresponding individual areas of said selected region, said selected areas corresponding to respective pixels of said spatial image;
- correlating said one pixel with at least one of said micromirrors of said array and orienting said at least one micromirror to reflect light from said wafer surface to a wavelength separation element to generate a wavelength-dispersed image, and directing the remaining micromirrors to not reflect light from said wafer surface to said wavelength separation element;
- and
- processing said wavelength dispersed image to deduce the value of a selected characteristic at said selected location of said surface of said wafer.
A system for performing a measurement at a selected location or point on the surface of a semiconductor wafer having thin film features formed in accordance with an integrated circuit design, said system comprising:
- a camera vision apparatus adapted to capture a spatial image of a surface region of the wafer known to contain the selected location;
- an in-image navigation processor adapted to process said spatial image with data representative of said integrated circuit design and identify one pixel in said spatial image corresponding to said selected location;
- a wavelength separation element;
- a spectrum image processor adapted to process a wavelength dispersed image from said wavelength separation element and compute a quantity to be measured;
- an addressable micromirror array comprising an array of individually controlled micromirrors each capable of being focused on a corresponding area of said surface region to direct light therefrom to said wavelength separation element, whereby each of said micromirrors corresponds to a unique pixel or group of unique pixels of said spatial image;
- and
- a control processor adapted to correlate said one pixel with at least a corresponding one of said micromirrors and control said micromirror array to select said at least one micromirror to reflect light from said wafer surface to said wavelength separation element.
A system for performing a measurement at a selected location or point on the surface of a semiconductor wafer having thin film features formed in accordance with an integrated circuit design, said system comprising:
- a camera facing a surface region of the wafer known to contain the selected location;
- an in-image navigation processor adapted to process an image from said camera with data representative of said integrated circuit design;
- a wavelength separation element;
- a spectrum image processor adapted to process a wavelength dispersed image from said wavelength separation element;
- an addressable micromirror array comprising an array of individually controlled micromirrors each capable of being focused on a corresponding unique area of said surface region and on a point of said wavelength separation element;
- and
- a control processor adapted to correlate individual pixels of said image coinciding with said selected location with corresponding one or ones of said micromirrors, and enable said one or ones of said micromirrors to reflect light to said wavelength separation element.
Dependencies are inferred from the claim text.