Measurement arrangement having a calibration substrate and electronic circuit

An electronic circuit comprising at least one electrical device under test (DUT) embedded in the electronic circuit, said device under test including electrical contact points which are electrically connected to the electronic circuit, such that at least one electrical contact point of said at least one electrical device under test is configured with a switch, wherein the switch comprises:

• one first electrical contact which is electrically connected to an electrical contact point of the electrical device under test;
• a second electrical contact which is configured for electrically connecting to a measurement port of a vector network analyzer;
• and
• a third electrical contact which is electrically connected to the electronic circuit, wherein the switch is configured such that, with the second electrical contact free and electrically connected to nothing, the switch makes an electrical connection between the first and the third electrical contacts, wherein an electrical connection between the second electrical contact, on one side, and the first and third electrical contacts, on the other side, is broken, and that, with the second electrical contact electrically connected to said measurement port of the vector network analyzer, the switch breaks the electrical connection between the third and first electrical contacts and makes an electrical connection between the first and second electrical contacts, wherein an electrical connection between the third electrical contact and the second electrical contact is broken.

A measurement apparatus comprising:

• a calibration substrate having at least one calibration standard comprising at least two electrical connection points, each for one measurement port of a vector network analyzer, at least one of said at least two electrical connection points of said at least one calibration standard including a switch, wherein the switch comprises:
• one first electrical contact which is electrically connected to all electrical connection point of the calibration standard;
• a second electrical contact which is configured for electrically connecting to a measurement port of the vector network analyzer;
• and
• a third electrical contact, wherein the switch is configured such that with the second electrical contact free and electrically connected to nothing, the switch makes an electrical connection between the first and third electrical contacts;
• wherein an electrical connection between the second and first electrical contacts and between the second and third electrical contacts is broken, and that with the second electrical contact electrically connected to said measurement port of the vector network analyzer, the switch breaks the electrical connection between the third and first electrical contacts and makes an electrical connection between the first and second electrical contacts, wherein an electrical connection between the third electrical contact and the second electrical contact is broken;
• and
• an electronic circuit comprising at least one electrical device under test (DUT) embedded in the electronic circuit, said device under test including electrical contact points which are electrically connected to the electronic circuit, such that at least one electrical contact point of said at least one electrical device under test is configured with a switch, wherein the switch comprises:
• one first electrical contact which is electrically connected to an electrical contact point of the electrical device under test;
• a second electrical contact which is configured for electrically connecting to a measurement port of a vector network analyzer;
• and
• a third electrical contact which is electrically connected to the electronic circuit, wherein the switch is conntzured such that, with the second electrical contact free and electrically connected to nothing, the switch makes an electrical connection between the first and the third electrical contacts, wherein an electrical connection between the second electrical contact, on one side, and the first and third electrical contacts, on the other side, is broken, and that, with the second electrical contact electrically connected to said measurement port of the vector network analyzer, the switch breaks the electrical connection between the third and first electrical contacts and makes an electrical connection between the first and second electrical contacts, wherein an electrical connection between the third electrical contact and the second electrical contact is broken;
• wherein at least one switch of the calibration substrate and at least one switch of the electronic circuit which are assigned to the same measurement port of the vector network analyzer have identical electrical properties.