Field effect transistor and method of manufacturing the same
AssigneeKabushiki Kaisha Toshiba
InventorsTatsuo Shimizu, Atsuhiro Kinoshita, Hirotaka Nishino
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AssigneeKabushiki Kaisha Toshiba
InventorsTatsuo Shimizu, Atsuhiro Kinoshita, Hirotaka Nishino
Estimating the term…
A field effect transistor which can operate at a low threshold value includes: an n-type semiconductor region; a source region and a drain region separately formed in the n-type semiconductor region; a first insulating film formed in the semiconductor region between the source region and the drain region and containing silicon and oxygen; a second insulating film formed on the first insulating film and containing at least one material selected from Hf, Zr, and Ti and oxygen; and a gate electrode formed on the second insulating film. Ge is doped in an interface region including an interface between the first insulating film and the second insulating film, and an area density of the Ge has a peak on a first insulating film side in the interface region.
A field effect transistor comprising:
A method for manufacturing a field effect transistor, comprising the steps of:
A method for manufacturing a complementary field effect transistor, comprising the steps of:
Dependencies are inferred from the claim text.