Management of a non-volatile memory based on test quality

A method of configuring a memory system comprising a non-volatile memory, the method comprising:

• testing a plurality of non-volatile memories of a particular type;
• identifying memory locations in the non-volatile memories that are susceptible to error based on the testing;
• creating a profile of the particular type of non-volatile memories using the identifying;
• and
• managing a particular non-volatile memory of the particular type based on the profile.

A memory system comprising:

• a non-volatile memory comprising a plurality of blocks, wherein each of the blocks comprises a sequence of pages;
• and
• a processor for controlling access to the pages of the non-volatile memory, wherein the processor is configured to:
• manage a first set of corresponding pages in each of the blocks using a first approach, wherein the first set of corresponding pages comprise memory locations that were determined to be susceptible to error based on tests performed during a manufacturing process of the memory system;
• and
• manage a second set of corresponding pages in each of the blocks using a second approach, wherein the second set of corresponding pages comprise memory locations that were determined not to be susceptible to error based on the tests performed during the manufacturing process of the memory system.