Loading patent…
AssigneeKabushiki Kaisha Toshiba
InventorsSadayuki YOSHITOMI, Naoki Wakita, Fumie Fujii, Yuka ITANO
Estimating the term…
In one embodiment, a SPICE model parameter output apparatus is configured to output a SPICE model parameter of a high-frequency or analog MOSFET for a simulation of a semiconductor circuit. The apparatus includes a data input part to input shape data of the MOSFET and measurement data on frequency characteristics of the MOSFET. The apparatus further includes a substrate resistance calculating part configured to calculate a substrate resistance of a one-terminal substrate resistance model regarding the MOSFET, based on the measurement data. The apparatus further includes a SPICE model parameter output part configured to calculate the SPICE model parameter, based on the substrate resistance of the one-terminal substrate resistance model and the shape data, to output the calculated SPICE model parameter.
A SPICE model parameter output apparatus configured to output a SPICE model parameter of a high-frequency or analog MOSFET for a simulation of a semiconductor circuit, the apparatus comprising:
A SPICE model parameter output method of outputting a SPICE model parameter of a high-frequency or analog MOSFET for a simulation of a semiconductor circuit, the method comprising:
A computer readable recording medium storing a program to cause a computer to execute a SPICE model parameter output method of outputting a SPICE model parameter of a high-frequency or analog MOSFET for a simulation of a semiconductor circuit, the method comprising:
Dependencies are inferred from the claim text.