Evaluating high frequency time domain in embedded device probing

A computer program product, comprising a computer usable storage medium having a computer readable program code stored therein, said computer readable program code containing instructions that when executed by a processor of a computer system implement a method for evaluating a high-frequency signal (SNE) at a point of interest on a signal path by use of a remote signal (SFE) at a remote pickup point on the signal path, said evaluating comprising:

• deriving an inverse transfer function (iG) for the signal path by use of an input signal (TIN) and an output signal (TOUT), wherein the inverse transfer function (iG) is defined as a ratio of the Fourier Transform of the input signal (TIN) over the Fourier Transform of the output signal (TOUT) such that the inverse transfer function (iG) produces a value of the input signal (TIN) by use of a value of the output signal (TOUT) by eliminating signal degradation effects from the output signal (TOUT) in the reference path, wherein the input signal and the output signal are measured from two distant points on the reference path;
• calculating the high-frequency signal (SNE) at the point of interest on the signal path by applying the derived inverse transfer function (iG) to an argument of the remote signal (SFE) measured at the remote pickup point on the signal path, wherein the point of interest and the remote pickup point are two distant points on the signal path, wherein the high-frequency signal (SNE) is an electrical signal having a frequency above 1 GHz, wherein the high-frequency signal (SNE) and the remote signal (SFE) are represented as a respective time domain variable, wherein said deriving and said calculating are performed by a time domain evaluation process that operates in test equipment for electrical devices;
• and
• transferring the calculated high-frequency signal (SNE) to an output device of the test equipment.