Method for treating a metal element with ion beam
AssigneeQuertech Ingenierie
InventorDenis Busardo
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AssigneeQuertech Ingenierie
InventorDenis Busardo
Estimating the term…
The present invention relates to a method for treating a metal element subjected to an ion beam, where: the ions of the beam are selected from among boron, carbon, nitrogen, and oxygen; the ion acceleration voltage, greater than or equal to 10 kV, and the power of the beam, between 1 W and 10 kW, as well as the ion load per surface unit are selected so as to enable the implantation of ions onto an implantation area with a thickness eI of 0.05 μm to 5 μm, and also enable the diffusion of ions into an implantation/diffusion area with a thickness eI+eP, of 0.1 μm to 1,000 μm; the temperature TZF of the area of the metal element located under the implantation/diffusion area is less than or equal to a threshold temperature TSD. In this manner, metal surfaces having remarkable mechanical characteristics are advantageously produced.
1-15. (canceled)
A method for treating a metal element of a part, wherein the metal element has a thickness eM, the method comprising:
Dependencies are inferred from the claim text.