Generated set top calibration patterns in manufacturing
AssigneeScientific-Atlanta, Inc.
InventorsLeo Montreuil, Wayne B. Williams, Samuel H. Russ, Robert A. Kriete
Life of this patent
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Abstract
Included are systems and methods for performing an internal operations test to a set top terminal (STT). At least one embodiment of a method includes creating a test pattern for testing video functionality of the STT, sending the created test pattern to a digital encoder, and converting the test pattern to an analog signal.
Claims23
A method for performing an internal operations test to a set top terminal (STT), the method comprising:
- creating a test pattern for testing video functionality of the STT;
- sending the created test pattern to a digital encoder;
- and converting the test pattern to an analog signal.
A set top terminal (STT) configured for performing an internal functionality test, the STT comprising:
- a processor configured to facilitate creation of a test pattern for testing video functionality of the STT;
- and a digital encoder configured to receive the test pattern from the processor and convert the test pattern into an analog signal.
A computer readable medium for performing an internal operations test to a set top terminal (STT), the computer readable medium comprising:
- logic configured to create a test pattern for testing video functionality of the STT;
- logic configured to send the created test pattern to a digital encoder;
- and logic configured to convert the test pattern to an analog signal.
Dependencies are inferred from the claim text.