Bonding method, bonding apparatus, and manufacturing method of semiconductor device unsing the same
AssigneeKabushiki Kaisha Shinkawa
InventorsNobuyuki Aoyagi, Hiroaki Yoshino
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AssigneeKabushiki Kaisha Shinkawa
InventorsNobuyuki Aoyagi, Hiroaki Yoshino
Estimating the term…
Provided is a bonding apparatus capable of forming even loops at high speed. According to a bonding apparatus 1, a capillary 5 is lowered to a bonding position to bond an initial ball 10 to a pad 104 on an overhanging die 100. Here, a position of the capillary 5 in a Z direction and a load detected by a load sensor 7 are detected and stored every predetermined time period. A load change point is detected by referring to the stored load and the stored position. By subtracting the bonding position from a load changing position of the capillary 5 at the load change point, a movement amount Z of the capillary 5 from the load changing position to the bonding position is calculated. After the capillary 5 is lifted by the movement amount Z, a wire loop is formed between the pad 104 and a lead 105.
A bonding method of bonding a wire inserted through a capillary to a pad disposed on a free end of an overhanging die, the method comprising:
A bonding apparatus for performing bonding operation to a pad disposed on a free end of an overhanging die, the apparatus comprising:
A manufacturing method of a semiconductor device by performing bonding operation to a pad disposed on a free end of an overhanging die, the method comprising:
Dependencies are inferred from the claim text.