Method and device for temperature-based data refresh in non-volatile memories

A method comprising

• measuring a temperature of at least one location of a non-volatile memory;
• determining if said temperature measurement indicates that a data retention time of data stored at said at least one location is reduced below a threshold;
• and
• re-writing said data to said non-volatile memory in response to a positive determination.

A computer program product, comprising code sections for instructing a device to perform the method of

• measuring a temperature of at least one location of a non-volatile memory;
• determining if said temperature measurement indicates that a data retention time of data stored at said at least one location is reduced below a threshold;
• and
• re-writing said data to said non-volatile memory in response to a positive determination,
• when said computer program product is running on said device.

A module comprising

• a non-volatile memory;
• a data interface configured for accessing said non-volatile memory;
• a temperature sensor configured for measuring a temperature of at least one location of said non-volatile memory;
• a controller connected to said non-volatile memory and said temperature sensor, said controller being configured for determining if said temperature measurement indicates that a data retention time of data stored at said at least one location is reduced below a threshold and for re-writing said data to said non-volatile memory in response to a positive determination.