Method for supporting analytical work of solder printing state and solder printing inspection machine

A method for supporting analytical work of a solder printing state of a solder printer,

• wherein the method uses accumulated inspection result data, a plurality of boards that are sequentially introduced and processed in a production line including the solder printer and a solder printing inspection machine, a unique identification code that is described in each of the plurality of boards,
• wherein the solder printing inspection machine producing inspection result data bundled with the identification code on each board and information specifying an inspection order,
• wherein the inspection result data is accumulated in a solder printing inspection machine or a memory of an external device,
• wherein the method comprises:
• focusing on each of the plurality of boards introduced to the solder printing inspection machine for a purpose of inspection of each of the plurality of boards inspected previously, wherein focusing further comprises:
• specifying pieces of inspection result data of the plurality of boards that are inspected before the focused board is introduced to the solder printing inspection machine based on the information specifying the inspection order;
• checking the identification codes bundled with the pieces of inspection result data against the identification code of the focused board,
• wherein, when the inspection result data bundled with the identification code identical to that of the focused board is detected by the checking, recognizing that the focused board is a board corresponding to the inspection result data bundled with the identical identification code and is reintroduced to the production line;
• producing a graph in which pieces of quality data of the plurality of boards are arrayed in time series using the pieces of inspection result data of the plurality of boards inspected by the solder printing inspection machine,
• wherein the plurality of boards including the board recognized during focusing;
• and
• displaying the graph produced based on the recognition result while the quality data corresponding to at least one of the reintroduced board and a board corresponding to the inspection result data bundled with the identification code identical to that of the reintroduced board is explicitly shown.