Substrate processing apparatus and method of manufacturing semiconductor device
AssigneeHitachi Kokusai Electric Inc.
InventorsKenichi SUZAKI, Takuya JODA
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AssigneeHitachi Kokusai Electric Inc.
InventorsKenichi SUZAKI, Takuya JODA
Estimating the term…
Provided is technology for preventing breakage of an induction target part of a substrate processing apparatus using an induction heating method. The substrate processing apparatus including a reaction vessel configured to process a substrate therein; a first induction target part comprising a peripheral portion and a center portion wherein a thickness of the center portion is less than that of the peripheral portion, the first induction target part being configured to heat the substrate accommodated on the center portion; a second induction target part comprising a peripheral portion and a center portion wherein a thickness of the center portion is equal to or greater than that of the peripheral portion, the second induction target part being configured to heat the substrate accommodated on the center portion of the first induction target part; an induction target part holder configured to hold the first induction target part and the second induction target part in a manner that the second induction part is spaced apart from the first induction target part by a predetermined distance; and an induction heating device configured to heat at least the first and second induction target parts in the reaction vessel held by the induction target part holder using an induction heating method.
A substrate processing apparatus comprising:
A substrate processing apparatus comprising:
A method of manufacturing a semiconductor device, the method comprising:
Dependencies are inferred from the claim text.