Nand flash memory of using common p-well and method of operating the same
AssigneeIntellectual Discovery Co., Ltd.
InventorsHan-Sub Yoon, Jong-Suk Lee, Kae-Dal Kwack
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AssigneeIntellectual Discovery Co., Ltd.
InventorsHan-Sub Yoon, Jong-Suk Lee, Kae-Dal Kwack
Estimating the term…
A flash memory using hot carrier injection and a method of operating the same are provided. A plurality of strings constituting a page are formed on a single p-well and share the p-well. During a program operation, a string selection transistor is turned off, and electrons are accumulated in a source or drain region in response to a bias voltage applied to the p-well. Thereafter, the accumulated electrons are trapped in a charge trap layer of a memory cell in response to a program voltage applied through a word line. Also, during an erase operation, holes accumulated in response to a bias voltage applied to the p-well are trapped in the charge trap layer in response to an erase voltage. The flash memory performs NAND-type program and erase operations using hot carrier injection.
A flash memory comprising:
A method of programming a flash memory, comprising a plurality of strings, each string including a string selection transistor electrically connected to a bit line, memory cells electrically connected to the string selection transistor, and a ground selection transistor electrically connected to the memory cells, the method comprising:
A method of erasing a flash memory, comprising a plurality of strings, each string including a string selection transistor electrically connected to a bit line, memory cells electrically connected to the string selection transistor, and a ground selection transistor electrically connected to the memory cells, the method comprising:
Dependencies are inferred from the claim text.