Lithographic apparatus and scanning method
AssigneeASML Netherlands B.V.
InventorsGerben Frank DE LANGE, Johannes Catharinus Hubertus Mulkens
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AssigneeASML Netherlands B.V.
InventorsGerben Frank DE LANGE, Johannes Catharinus Hubertus Mulkens
Estimating the term…
A lithographic apparatus includes a first support to support a first patterning device; a second support to support a second patterning device, each of the first and the second patterning device capable of imparting a radiation beam with a pattern in its cross-section to form a patterned radiation beam; a substrate table constructed to hold a substrate; a projection system to project the patterned radiation beam onto a target portion of the substrate; a controller to drive the first support and the second support and arranged to: drive the first support to perform a scanning movement; drive the second support to accelerate during at least part of the scanning movement of the first support; and drive the second support to perform a scanning movement upon completion of the scanning movement of the first support, so as to scan a die adjacent a die previously scanned during the scanning movement of the first support.
A lithographic apparatus comprising:
A lithographic scanning method for projecting patterns from a first patterning device and a second patterning device onto a substrate, the method comprising:
Dependencies are inferred from the claim text.