Apparatus and method for monitoring current flow to integrated circuit in temperature-compensated manner
AssigneeATI Technologies ULC
InventorShahin Solki
Life of this patent
Estimating the term…
Abstract
A circuit and method for monitoring current flow to an integrated circuit (IC), alone or mounted on a substrate, in a temperature-compensated manner. In accordance with a preferred embodiment, a plurality of resistances having substantially equal temperature coefficients establishes a ratio of an output voltage and an internally measured voltage, with the output voltage corresponding to a voltage drop across an inherent resistance within the IC or on the substrate.
Claims16
An apparatus including an integrated circuit, comprising:
- an integrated circuit (IC) including
- at least one active device,
- at least one conductive IC circuit path operably coupled to said at least one active device,
- at least one IC electrode operably coupled to said at least one conductive IC circuit path for conveying current between an external connection and said at least one active device via said at least one conductive IC circuit path, and
- voltage measurement circuitry, including a plurality of resistances having substantially equal temperature coefficients, operably coupled between said at least one IC electrode and said at least one active device for measuring at least IC electrode and device voltages at said at least one IC electrode and said at least one active device, respectively, to provide a measured voltage related to a voltage difference between said IC electrode and device voltages;
- wherein
- said measured voltage is related to a current flowing between said at least one IC electrode and said at least one active device, and
- a ratio of said measured voltage and said voltage difference between said IC electrode and device voltages is substantially independent from temperature variations.
A method for monitoring current flow to an integrated circuit, comprising:
- measuring at least IC electrode and device voltages at least one IC electrode and at least one active device, respectively;
- and
- providing a measured voltage related to a voltage difference between said IC electrode and device voltages;
- wherein
- said integrated circuit (IC) includes
- said at least one active device,
- at least one conductive IC circuit path operably coupled to said at least one active device, and
- said at least one IC electrode operably coupled to said at least one conductive IC circuit path for conveying current between an external connection and said at least one active device via said at least one conductive IC circuit path,
- said measured voltage is related to a current flowing between said at least one IC electrode and said at least one active device, and
- a ratio of said measured voltage and said voltage difference between said IC electrode and device voltages is substantially independent from temperature variations.
A computer readable medium comprising a plurality of executable instructions that, when executed by an integrated circuit design system, cause the integrated circuit design system to produce:
- an integrated circuit (IC) including
- at least one active device,
- at least one conductive IC circuit path operably coupled to said at least one active device,
- at least one IC electrode operably coupled to said at least one conductive IC circuit path for conveying current between an external connection and said at least one active device via said at least one conductive IC circuit path, and
- voltage measurement circuitry, including a plurality of resistances having substantially equal temperature coefficients, operably coupled between said at least one IC electrode and said at least one active device for measuring at least IC electrode and device voltages at said at least one IC electrode and said at least one active device, respectively, to provide a measured voltage related to a voltage difference between said IC electrode and device voltages;
- wherein
- said measured voltage is related to a current flowing between said at least one IC electrode and said at least one active device, and
- a ratio of said measured voltage and said voltage difference between said IC electrode and device voltages is substantially independent from temperature variations.
Dependencies are inferred from the claim text.