Obscured feature detector with built-in correction module

An obscured feature detector comprising:

• a plurality of sensor plates, each having a capacitance that varies based on:
• (a) the proximity of the sensor plates to one or more surrounding objects, and (b) the dielectric constant(s) of the surrounding object(s);
• a sensing circuit coupled to the sensor plates, the sensing circuit being configured to measure the capacitance of each of the sensor plates;
• a controller coupled to the sensing circuit, the controller being configured to analyze the capacitances measured by the sensing circuit;
• a surface material detection module coupled to the controller and configured to detect one or more properties of a detected surface;
• and
• a correction module coupled to the controller and configured to apply corrections to the measured capacitances using at least one of the properties detected by the surface detection module.

A method for determining the location of an obscured feature behind a surface, the method comprising:

• placing an obscured feature detector on the surface, the obscured feature detector having a plurality of sensor plates arranged in an array;
• measuring capacitance readings in an area surrounding one or more of the sensor plates;
• detecting at least one property of the surface;
• correcting the capacitance readings, using the detected property of the surface;
• identifying, based upon the corrected capacitance readings, the location of one or a plurality of obscured features;
• and
• activating one or a plurality of indicators to identify the location of an obscured feature.