Semiconductor Device and Its Manufacturing Method
AssigneeHitachi, Ltd.
InventorsKenji MIYAKOSHI, Shinichiro Wada, Yohei Yanagida, Takayuki Oshima, Keigo Kitazawa
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AssigneeHitachi, Ltd.
InventorsKenji MIYAKOSHI, Shinichiro Wada, Yohei Yanagida, Takayuki Oshima, Keigo Kitazawa
Estimating the term…
In an LDMOS transistor, a channel length is reduced to increase a saturation current without causing an off-state breakdown voltage optimized in terms of trade-off between an on-resistance and the off-state breakdown voltage. A short channel region is selectively formed between an element isolation film and a low-concentration body region in which a channel is formed such that the short channel region is located immediately below a gate oxide film. The short channel region has a conduction type opposite to that of the low-concentration body region and has a carrier concentration higher than that of the low-concentration body region. The body region is retreated by the presence of the short channel region toward a high-concentration source region.
A semiconductor device comprising:
A method of manufacturing a semiconductor device including a semiconductor substrate and a MOS transistor formed on the semiconductor substrate, the method comprising:
Dependencies are inferred from the claim text.