Focused ion beam apparatus
OwnerTakashi Ogawa, Kenichi Nishinaka +1inventors
InventorsTakashi Ogawa, Kenichi Nishinaka, Yasuhiko Sugiyama
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Abstract
A focused ion beam apparatus includes an ion gun unit having an emitter tip, a gas supply unit including an ion source gas nozzle configured to supply gas to the tip and an ion source gas supply source. An extracting electrode ionizes the gas adsorbed onto the surface of the tip and extracts ions by applying a voltage between the extracting electrode and the tip. A cathode electrode accelerates the ions toward a sample, and a gun alignment electrode positioned on the side of the sample with respect to the ion gun unit and adjusts the direction of irradiation of the ion beam ejected from the ion gun unit. A lens system includes a focusing lens electrode and an objective lens electrode to focus the ion beam onto the sample.
Claims6
A focused ion beam apparatus comprising:
- a gas field ion gun unit including:
- an emitter tip,
- a gas supply unit to supply gas to the tip,
- an extracting electrode configured to ionize the gas adsorbed onto the surface of the tip and extract ions by applying a voltage between the extracting electrode and the tip, and
- a cathode electrode to accelerate the ions toward a sample;
- a gun alignment electrode configured to adjust the direction of irradiation of the ion beam ejected from the gas field ion gun unit;
- and
- a lens system that focuses the ion beam onto the sample.
Dependencies are inferred from the claim text.