US 2011/0214025 A1Published application

Control method of non-volatile semiconductor device

AssigneeElpida Memory, Inc.

InventorAkiyoshi Seko

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Abstract

Disclosed is a control method of a non-volatile semiconductor device including cells, wherein a stress for rewriting information is applied to each of the cells, and each cell has a first time period as a period of time until a characteristic of the cell is stabilized to expectation value information after the stress for rewriting information is applied, a plurality of first sequences, in each of which writing is performed to a plurality of the cells continuously in time series, and a plurality of second sequences, in each of which verification of a plurality of the cells is performed continuously in time series, after the writing performed continuous in time series. When repeating, continuously in time series, a plurality of sets, each of the sets comprising a plurality of the first sequences and a plurality of the second sequences, a period of time from completion of application of the stress to each of the cells in the first sequence until start of the verification in the second sequence for the each of the cells subjected to the stress application, is arranged for each of all of the sets, wherein the period of time is the first time period or more.

Claims24

Dependent claims

A control method of a non-volatile semiconductor device including a plurality of cells, to at least one of which a stress for rewriting information is applied, each of said cells having a first time period as a period of time in which a characteristic of said cell is stabilized to expectation value information after said stress for rewriting information is applied to said cell, said method comprising:

a plurality of first sequences, in each of said first sequences, writing to a plurality of said cells being performed continuously in time series;
and
a plurality of second sequences, in each of said second sequences, verification of a plurality of said cells being performed continuously in time series, after said writing performed continuous in time series, said method further comprising
in repeating a plurality of sets continuously in time series, each of said sets comprising a plurality of said first sequences and a plurality of said second sequences,
arranging, for each set of entirety of said sets, a period of time from completion of application of said stress to each of said cells in said first sequence until start of said verification in said second sequence for said each of said cells subjected to said stress application, to said first time period or more.

2 more elements

Dependencies are inferred from the claim text.